TY - JOUR
T1 - A design of linearity built-in self-test for current-steering DAC
AU - Ting, Hsin Wen
AU - Chang, Soon Jyh
AU - Huang, Su Ling
N1 - Funding Information:
Acknowledgment This work was supported in part by the grant of NSC-98-2218-E-151-006 from National Science Council (NSC), Taiwan.
PY - 2011/2
Y1 - 2011/2
N2 - In this paper, a current-mode Built-In Self-Test (BIST) scheme is proposed for on-chip estimating static non-linearity errors in current-steering digital-to-analog converters (DACs). The proposed DAC BIST scheme is designed to verify a 10-bit segmented current-steering DAC, consist of a 5-bit coarse DAC and a 5-bit fine one. This proposed BIST scheme includes a current-mode sample-and-difference circuit to increase the sampling current accuracy and control a current-controlled oscillator (ICO). In addition, only 36 measurements are required by using the selected-code method rather than 1024 measurements for the conventionally-utilized all-code method. Compared to the conventionally-utilized all-code method, about 85-% reduction of test time can be achieved.
AB - In this paper, a current-mode Built-In Self-Test (BIST) scheme is proposed for on-chip estimating static non-linearity errors in current-steering digital-to-analog converters (DACs). The proposed DAC BIST scheme is designed to verify a 10-bit segmented current-steering DAC, consist of a 5-bit coarse DAC and a 5-bit fine one. This proposed BIST scheme includes a current-mode sample-and-difference circuit to increase the sampling current accuracy and control a current-controlled oscillator (ICO). In addition, only 36 measurements are required by using the selected-code method rather than 1024 measurements for the conventionally-utilized all-code method. Compared to the conventionally-utilized all-code method, about 85-% reduction of test time can be achieved.
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U2 - 10.1007/s10836-010-5187-2
DO - 10.1007/s10836-010-5187-2
M3 - Article
AN - SCOPUS:79952194143
VL - 27
SP - 85
EP - 94
JO - Journal of Electronic Testing: Theory and Applications (JETTA)
JF - Journal of Electronic Testing: Theory and Applications (JETTA)
SN - 0923-8174
IS - 1
ER -