Abstract
In this paper, a current-mode Built-In Self-Test (BIST) scheme is proposed for on-chip estimating static non-linearity errors in current-steering digital-to-analog converters (DACs). The proposed DAC BIST scheme is designed to verify a 10-bit segmented current-steering DAC, consist of a 5-bit coarse DAC and a 5-bit fine one. This proposed BIST scheme includes a current-mode sample-and-difference circuit to increase the sampling current accuracy and control a current-controlled oscillator (ICO). In addition, only 36 measurements are required by using the selected-code method rather than 1024 measurements for the conventionally-utilized all-code method. Compared to the conventionally-utilized all-code method, about 85-% reduction of test time can be achieved.
Original language | English |
---|---|
Pages (from-to) | 85-94 |
Number of pages | 10 |
Journal | Journal of Electronic Testing: Theory and Applications (JETTA) |
Volume | 27 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2011 Feb 1 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering