TY - GEN
T1 - A digital peak current delay compensation for primary-side regulation flyback adapter
AU - Niou, Chun Ping
AU - Tsai, Chien Hung
AU - Chen, Ta Jin
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/6/5
Y1 - 2018/6/5
N2 - A digital control primary-side regulation (PSR) flyback adapter with peak current delay compensation technique is proposed. In USB type adapters, over-current protection (OCP) or constant current (CC) control is used to protect the system. However, there is a primary-side peak current detection error caused by the propagation delay in control circuits, which makes the OCP and CC control incorrect. This paper proposes a digital method named as two-cycle-averaged compensation to solve current variation caused by the propagation delay. This work can reduce the cost of digital hardware, and without losing the compensation effect. The output current accuracy measurement result of this work is smaller than 2.8%.
AB - A digital control primary-side regulation (PSR) flyback adapter with peak current delay compensation technique is proposed. In USB type adapters, over-current protection (OCP) or constant current (CC) control is used to protect the system. However, there is a primary-side peak current detection error caused by the propagation delay in control circuits, which makes the OCP and CC control incorrect. This paper proposes a digital method named as two-cycle-averaged compensation to solve current variation caused by the propagation delay. This work can reduce the cost of digital hardware, and without losing the compensation effect. The output current accuracy measurement result of this work is smaller than 2.8%.
UR - http://www.scopus.com/inward/record.url?scp=85049309279&partnerID=8YFLogxK
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U2 - 10.1109/VLSI-DAT.2018.8373260
DO - 10.1109/VLSI-DAT.2018.8373260
M3 - Conference contribution
AN - SCOPUS:85049309279
T3 - 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018
SP - 1
EP - 4
BT - 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018
Y2 - 16 April 2018 through 19 April 2018
ER -