A digital peak current delay compensation for primary-side regulation flyback adapter

Chun Ping Niou, Chien Hung Tsai, Ta Jin Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A digital control primary-side regulation (PSR) flyback adapter with peak current delay compensation technique is proposed. In USB type adapters, over-current protection (OCP) or constant current (CC) control is used to protect the system. However, there is a primary-side peak current detection error caused by the propagation delay in control circuits, which makes the OCP and CC control incorrect. This paper proposes a digital method named as two-cycle-averaged compensation to solve current variation caused by the propagation delay. This work can reduce the cost of digital hardware, and without losing the compensation effect. The output current accuracy measurement result of this work is smaller than 2.8%.

Original languageEnglish
Title of host publication2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781538642603
DOIs
Publication statusPublished - 2018 Jun 5
Event2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018 - Hsinchu, Taiwan
Duration: 2018 Apr 162018 Apr 19

Publication series

Name2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018

Other

Other2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018
CountryTaiwan
CityHsinchu
Period18-04-1618-04-19

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Control and Optimization
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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  • Cite this

    Niou, C. P., Tsai, C. H., & Chen, T. J. (2018). A digital peak current delay compensation for primary-side regulation flyback adapter. In 2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018 (pp. 1-4). (2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VLSI-DAT.2018.8373260