A digitally controlled buck converter with current sensor-less adaptive voltage positioning (AVP) mechanism

Kai Yu Hu, Bo Ming Chen, Chien-Hung Tsai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Adaptive voltage positioning (AVP) technique has been widely used in voltage regulator (VR) applications. In this paper, a digitally controlled buck converter with the proposed current sensor-less AVP technique is presented. Without the need for sensing or sampling the loading condition, the proposed control architecture utilizes the error signal of the digitalized controller to obtain the current information. The elimination of a current analog-to-digital converter (ADC) or any current sensing circuits significantly reduced the size and cost of the digital controller. A 781.25-kHz, single-phase synchronous buck converter which the input voltage is ranging from 2.7 to 4.2 V and an optional output between 0.9 to 1.2 V was implemented using the field-programmable gate array (FPGA). Experimental results show that an optimal AVP function was achieved in transient response to a 200-650 mA step load change within 30 μs.

Original languageEnglish
Title of host publication2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509039692
DOIs
Publication statusPublished - 2017 Jun 5
Event2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017 - Hsinchu, Taiwan
Duration: 2017 Apr 242017 Apr 27

Publication series

Name2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017

Other

Other2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017
CountryTaiwan
CityHsinchu
Period17-04-2417-04-27

Fingerprint

Sensors
Electric potential
Controllers
Voltage regulators
Digital to analog conversion
Transient analysis
Field programmable gate arrays (FPGA)
Sampling
Networks (circuits)
Costs

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Cite this

Hu, K. Y., Chen, B. M., & Tsai, C-H. (2017). A digitally controlled buck converter with current sensor-less adaptive voltage positioning (AVP) mechanism. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017 [7939664] (2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VLSI-DAT.2017.7939664
Hu, Kai Yu ; Chen, Bo Ming ; Tsai, Chien-Hung. / A digitally controlled buck converter with current sensor-less adaptive voltage positioning (AVP) mechanism. 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017. Institute of Electrical and Electronics Engineers Inc., 2017. (2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017).
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Hu, KY, Chen, BM & Tsai, C-H 2017, A digitally controlled buck converter with current sensor-less adaptive voltage positioning (AVP) mechanism. in 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017., 7939664, 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Institute of Electrical and Electronics Engineers Inc., 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, 17-04-24. https://doi.org/10.1109/VLSI-DAT.2017.7939664

A digitally controlled buck converter with current sensor-less adaptive voltage positioning (AVP) mechanism. / Hu, Kai Yu; Chen, Bo Ming; Tsai, Chien-Hung.

2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 7939664 (2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Hu KY, Chen BM, Tsai C-H. A digitally controlled buck converter with current sensor-less adaptive voltage positioning (AVP) mechanism. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017. Institute of Electrical and Electronics Engineers Inc. 2017. 7939664. (2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017). https://doi.org/10.1109/VLSI-DAT.2017.7939664