A Discrete Degradation Model for UltraThin Gate Oxide Data

M.-H. Hsieh, Shuen-Lin Jeng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationJoint Statistical Meetings
Place of PublicationSeattle, USA
Publication statusPublished - 2006 Aug 6

Cite this

Hsieh, M-H., & Jeng, S-L. (2006). A Discrete Degradation Model for UltraThin Gate Oxide Data. In Joint Statistical Meetings Seattle, USA.