| Original language | English |
|---|---|
| Title of host publication | Joint Statistical Meetings |
| Place of Publication | Seattle, USA |
| Publication status | Published - 2006 Aug 6 |
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A Discrete Degradation Model for UltraThin Gate Oxide Data
- M.-H. Hsieh
- , Shuen-Lin Jeng
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution