Original language | English |
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Title of host publication | International Conference on Engineering Education (ICEE) |
Place of Publication | Chicago |
Pages | 43-53 |
Volume | II |
Publication status | Published - 1997 Aug |
A joint project to develop a VLSI testing and design for testability course for universities in Taiwan
C.-L. Lee, J.-Y. Jou, C.-S. Lin, J.-E. Chen, K.-J. Lee, C.-C. Su, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution