A joint project to develop a VLSI testing and design for testability course for universities in Taiwan

C.-L. Lee, J.-Y. Jou, C.-S. Lin, J.-E. Chen, K.-J. Lee, C.-C. Su, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Conference on Engineering Education (ICEE)
Place of PublicationChicago
Publication statusPublished - 1997 Aug

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