A low-cost diagnosis methodology for pipelined A/D converters

Chih Haur Huang, Kuen-Jong Lee, Soon-Jyh Chang

Research output: Contribution to journalConference article

5 Citations (Scopus)

Abstract

Pipelined A/D Converters have intrinsic high-speed characteristics and are widely used in wideband communication and video systems. In this paper, we propose a low-cost diagnosis methodology for pipelined A/D converters which employs three techniques in the diagnosis process: (1) time-division- multiplexing (TDM), (2) scan based testing, and (3) VCO based measurement. The last technique is developed to diagnose the most critical mixed-signal functional blocks in the pipelined ADC including the sample-and-hold amplifier (SHA) and the digital-to-analog sub-converters (DASC). It provides a great capability to distinct signals with very small voltage difference and is insensitive to process variations and immune to noise induced errors. The diagnosis methodology is power- and area- efficient because it only needs low-complexity and low-area BIST circuits to accomplish the full diagnosis process. A 12-bit pipelined A/D converter with the proposed diagnosis scheme is designed and simulated using the TSMC 0.25um 1P5M technology to demonstrate the effectiveness of the proposed methodology.

Original languageEnglish
Pages (from-to)296-301
Number of pages6
JournalProceedings of the Asian Test Symposium
Publication statusPublished - 2004 Dec 1
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
Duration: 2004 Nov 152004 Nov 17

Fingerprint

Costs
Built-in self test
Time division multiplexing
Variable frequency oscillators
Networks (circuits)
Communication
Testing
Electric potential

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

@article{98f0e08baf8a439c9bdb1bcca66f277e,
title = "A low-cost diagnosis methodology for pipelined A/D converters",
abstract = "Pipelined A/D Converters have intrinsic high-speed characteristics and are widely used in wideband communication and video systems. In this paper, we propose a low-cost diagnosis methodology for pipelined A/D converters which employs three techniques in the diagnosis process: (1) time-division- multiplexing (TDM), (2) scan based testing, and (3) VCO based measurement. The last technique is developed to diagnose the most critical mixed-signal functional blocks in the pipelined ADC including the sample-and-hold amplifier (SHA) and the digital-to-analog sub-converters (DASC). It provides a great capability to distinct signals with very small voltage difference and is insensitive to process variations and immune to noise induced errors. The diagnosis methodology is power- and area- efficient because it only needs low-complexity and low-area BIST circuits to accomplish the full diagnosis process. A 12-bit pipelined A/D converter with the proposed diagnosis scheme is designed and simulated using the TSMC 0.25um 1P5M technology to demonstrate the effectiveness of the proposed methodology.",
author = "Huang, {Chih Haur} and Kuen-Jong Lee and Soon-Jyh Chang",
year = "2004",
month = "12",
day = "1",
language = "English",
pages = "296--301",
journal = "Proceedings of the Asian Test Symposium",
issn = "1081-7735",
publisher = "IEEE Computer Society",

}

A low-cost diagnosis methodology for pipelined A/D converters. / Huang, Chih Haur; Lee, Kuen-Jong; Chang, Soon-Jyh.

In: Proceedings of the Asian Test Symposium, 01.12.2004, p. 296-301.

Research output: Contribution to journalConference article

TY - JOUR

T1 - A low-cost diagnosis methodology for pipelined A/D converters

AU - Huang, Chih Haur

AU - Lee, Kuen-Jong

AU - Chang, Soon-Jyh

PY - 2004/12/1

Y1 - 2004/12/1

N2 - Pipelined A/D Converters have intrinsic high-speed characteristics and are widely used in wideband communication and video systems. In this paper, we propose a low-cost diagnosis methodology for pipelined A/D converters which employs three techniques in the diagnosis process: (1) time-division- multiplexing (TDM), (2) scan based testing, and (3) VCO based measurement. The last technique is developed to diagnose the most critical mixed-signal functional blocks in the pipelined ADC including the sample-and-hold amplifier (SHA) and the digital-to-analog sub-converters (DASC). It provides a great capability to distinct signals with very small voltage difference and is insensitive to process variations and immune to noise induced errors. The diagnosis methodology is power- and area- efficient because it only needs low-complexity and low-area BIST circuits to accomplish the full diagnosis process. A 12-bit pipelined A/D converter with the proposed diagnosis scheme is designed and simulated using the TSMC 0.25um 1P5M technology to demonstrate the effectiveness of the proposed methodology.

AB - Pipelined A/D Converters have intrinsic high-speed characteristics and are widely used in wideband communication and video systems. In this paper, we propose a low-cost diagnosis methodology for pipelined A/D converters which employs three techniques in the diagnosis process: (1) time-division- multiplexing (TDM), (2) scan based testing, and (3) VCO based measurement. The last technique is developed to diagnose the most critical mixed-signal functional blocks in the pipelined ADC including the sample-and-hold amplifier (SHA) and the digital-to-analog sub-converters (DASC). It provides a great capability to distinct signals with very small voltage difference and is insensitive to process variations and immune to noise induced errors. The diagnosis methodology is power- and area- efficient because it only needs low-complexity and low-area BIST circuits to accomplish the full diagnosis process. A 12-bit pipelined A/D converter with the proposed diagnosis scheme is designed and simulated using the TSMC 0.25um 1P5M technology to demonstrate the effectiveness of the proposed methodology.

UR - http://www.scopus.com/inward/record.url?scp=13244291303&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=13244291303&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:13244291303

SP - 296

EP - 301

JO - Proceedings of the Asian Test Symposium

JF - Proceedings of the Asian Test Symposium

SN - 1081-7735

ER -