TY - GEN
T1 - A low-power design methodology for sigma-delta modulators with relaxation of required circuit specifications
AU - Hong, Jia Hua
AU - Liang, Ming Chun
AU - Wong, Jing Yi
AU - Lee, Shuenn Yuh
PY - 2013/8/15
Y1 - 2013/8/15
N2 - A design methodology of high-order sigma-delta modulators (SDMs) with relaxation of required circuit specifications is proposed to reduce the required power consumption and to be suitable for the nano-scale circuit. According to the proposed design flow, more relaxed circuit specifications can be selected so that designers can maintain system performance. One design example is employed to verify the proposed design flow. Circuit-level simulation reveals that the power consumption is lower under the same system performance compared with a conventional design flow. The circuits are implement with TSMC 90nm 1P9M CMOS process and the measured signal-to-noise distortion ratio (SNDR) is 64.5 dB, with a power consumption of 303μW.
AB - A design methodology of high-order sigma-delta modulators (SDMs) with relaxation of required circuit specifications is proposed to reduce the required power consumption and to be suitable for the nano-scale circuit. According to the proposed design flow, more relaxed circuit specifications can be selected so that designers can maintain system performance. One design example is employed to verify the proposed design flow. Circuit-level simulation reveals that the power consumption is lower under the same system performance compared with a conventional design flow. The circuits are implement with TSMC 90nm 1P9M CMOS process and the measured signal-to-noise distortion ratio (SNDR) is 64.5 dB, with a power consumption of 303μW.
UR - http://www.scopus.com/inward/record.url?scp=84881327036&partnerID=8YFLogxK
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U2 - 10.1109/VLDI-DAT.2013.6533872
DO - 10.1109/VLDI-DAT.2013.6533872
M3 - Conference contribution
AN - SCOPUS:84881327036
SN - 9781467344357
T3 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
BT - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
T2 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
Y2 - 22 April 2013 through 24 April 2013
ER -