Abstract
A new gate driver composed of amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors (TFTs) is proposed. By turning off TFTs completely to suppress the leakage current and eliminating the unnecessary charge and discharge currents, the power consumption of the proposed gate driver is reduced. Simulation results indicate that the proposed gate driver can be operated successfully with depletion-mode a-IGZO TFTs and the power consumption is reduced by 18.9% of the previously reported result.
Original language | English |
---|---|
Pages (from-to) | 1039-1042 |
Number of pages | 4 |
Journal | Digest of Technical Papers - SID International Symposium |
Volume | 45 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2014 Jun |
All Science Journal Classification (ASJC) codes
- General Engineering