A memory yield improvement scheme combining built-in self-repair and error correction codes

Tze Hsin Wu, Po Yuan Chen, Mincent Lee, Bin Yen Lin, Cheng Wen Wu, Chen Hung Tien, Hung Chih Lin, Hao Chen, Ching Nen Peng, Min Jer Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

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Mathematics

Engineering & Materials Science