@inproceedings{c83560d572a943fc8a66827d7bd34174,
title = "A new algorithm for automatic inspection between object contour and corner database",
abstract = "In this paper, a new algorithm based on the 3-4 chamfer matching for object classification is proposed. Since translation, rotation and scaling of edges are allowed, the proposed new algorithm is more feasible than the conventional chamfer matching algorithm. Memory economization of the database proves that the proposed algorithm is more efficient than other matching algorithms. Compared to the contour database, the requirement of the memory space is reduced to 1/40 and the CPU time speed up is more than 5 to 1.",
author = "Yan, {Dar An} and Chen, {Chin Hsing} and Ho, {Yu Kuen}",
note = "Publisher Copyright: {\textcopyright} 1992 IEEE.; 1992 IEEE International Workshop on Emerging Technologies and Factory Automation, ETFA 1992 ; Conference date: 11-08-1992 Through 14-08-1992",
year = "1992",
doi = "10.1109/ETFA.1992.683321",
language = "English",
series = "IEEE International Conference on Emerging Technologies and Factory Automation, ETFA",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "593--597",
editor = "R. Zurawski and T.S. Dillon",
booktitle = "IEEE International Workshop on Emerging Technologies and Factory Automation",
address = "United States",
}