A new algorithm for automatic inspection between object contour and corner database

Dar An Yan, Chin-Hsing Chen, Yu Kuen Ho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, a new algorithm based on the 3-4 chamfer matching for object classification is proposed. Since translation, rotation and scaling of edges are allowed, the proposed new algorithm is more feasible than the conventional chamfer matching algorithm. Memory economization of the database proves that the proposed algorithm is more efficient than other matching algorithms. Compared to the contour database, the requirement of the memory space is reduced to 1/40 and the CPU time speed up is more than 5 to 1.

Original languageEnglish
Title of host publicationIEEE International Workshop on Emerging Technologies and Factory Automation
Subtitle of host publicationTechnology for the Intelligent Factory - Proceedings, ETFA 1992
EditorsR. Zurawski, T.S. Dillon
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages593-597
Number of pages5
ISBN (Electronic)0780308867
DOIs
Publication statusPublished - 1992 Jan 1
Event1992 IEEE International Workshop on Emerging Technologies and Factory Automation, ETFA 1992 - Melbourne, Australia
Duration: 1992 Aug 111992 Aug 14

Publication series

NameIEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Volume1992-August
ISSN (Print)1946-0740
ISSN (Electronic)1946-0759

Conference

Conference1992 IEEE International Workshop on Emerging Technologies and Factory Automation, ETFA 1992
CountryAustralia
CityMelbourne
Period92-08-1192-08-14

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Inspection
Data storage equipment
Program processors

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Computer Science Applications

Cite this

Yan, D. A., Chen, C-H., & Ho, Y. K. (1992). A new algorithm for automatic inspection between object contour and corner database. In R. Zurawski, & T. S. Dillon (Eds.), IEEE International Workshop on Emerging Technologies and Factory Automation: Technology for the Intelligent Factory - Proceedings, ETFA 1992 (pp. 593-597). [683321] (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; Vol. 1992-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ETFA.1992.683321
Yan, Dar An ; Chen, Chin-Hsing ; Ho, Yu Kuen. / A new algorithm for automatic inspection between object contour and corner database. IEEE International Workshop on Emerging Technologies and Factory Automation: Technology for the Intelligent Factory - Proceedings, ETFA 1992. editor / R. Zurawski ; T.S. Dillon. Institute of Electrical and Electronics Engineers Inc., 1992. pp. 593-597 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA).
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abstract = "In this paper, a new algorithm based on the 3-4 chamfer matching for object classification is proposed. Since translation, rotation and scaling of edges are allowed, the proposed new algorithm is more feasible than the conventional chamfer matching algorithm. Memory economization of the database proves that the proposed algorithm is more efficient than other matching algorithms. Compared to the contour database, the requirement of the memory space is reduced to 1/40 and the CPU time speed up is more than 5 to 1.",
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Yan, DA, Chen, C-H & Ho, YK 1992, A new algorithm for automatic inspection between object contour and corner database. in R Zurawski & TS Dillon (eds), IEEE International Workshop on Emerging Technologies and Factory Automation: Technology for the Intelligent Factory - Proceedings, ETFA 1992., 683321, IEEE International Conference on Emerging Technologies and Factory Automation, ETFA, vol. 1992-August, Institute of Electrical and Electronics Engineers Inc., pp. 593-597, 1992 IEEE International Workshop on Emerging Technologies and Factory Automation, ETFA 1992, Melbourne, Australia, 92-08-11. https://doi.org/10.1109/ETFA.1992.683321

A new algorithm for automatic inspection between object contour and corner database. / Yan, Dar An; Chen, Chin-Hsing; Ho, Yu Kuen.

IEEE International Workshop on Emerging Technologies and Factory Automation: Technology for the Intelligent Factory - Proceedings, ETFA 1992. ed. / R. Zurawski; T.S. Dillon. Institute of Electrical and Electronics Engineers Inc., 1992. p. 593-597 683321 (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; Vol. 1992-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Yan DA, Chen C-H, Ho YK. A new algorithm for automatic inspection between object contour and corner database. In Zurawski R, Dillon TS, editors, IEEE International Workshop on Emerging Technologies and Factory Automation: Technology for the Intelligent Factory - Proceedings, ETFA 1992. Institute of Electrical and Electronics Engineers Inc. 1992. p. 593-597. 683321. (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA). https://doi.org/10.1109/ETFA.1992.683321