| Original language | English |
|---|---|
| Pages (from-to) | 1-20 |
| Journal | Journal of Applied Statistics |
| Volume | 46 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2019 |
Cite this
Li, C. I., Pan, J. N., & Huang, M. H. (2019). A new demerit control chart for monitoring the quality of multivariate Poisson processes. Journal of Applied Statistics, 46(4), 1-20. https://doi.org/10.1080/02664763.2018.1510477
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title = "A new demerit control chart for monitoring the quality of multivariate Poisson processes",
author = "Li, {C. I.} and Pan, {J. N.} and Huang, {M. H.}",
year = "2019",
doi = "10.1080/02664763.2018.1510477",
language = "English",
volume = "46",
pages = "1--20",
journal = "Journal of Applied Statistics",
issn = "0266-4763",
publisher = "Routledge",
number = "4",
}
Li, CI, Pan, JN & Huang, MH 2019, 'A new demerit control chart for monitoring the quality of multivariate Poisson processes', Journal of Applied Statistics, vol. 46, no. 4, pp. 1-20. https://doi.org/10.1080/02664763.2018.1510477
A new demerit control chart for monitoring the quality of multivariate Poisson processes. / Li, C. I.; Pan, J. N.; Huang, M. H.
In: Journal of Applied Statistics, Vol. 46, No. 4, 2019, p. 1-20.Research output: Contribution to journal › Article
TY - JOUR
T1 - A new demerit control chart for monitoring the quality of multivariate Poisson processes
AU - Li, C. I.
AU - Pan, J. N.
AU - Huang, M. H.
PY - 2019
Y1 - 2019
U2 - 10.1080/02664763.2018.1510477
DO - 10.1080/02664763.2018.1510477
M3 - Article
VL - 46
SP - 1
EP - 20
JO - Journal of Applied Statistics
JF - Journal of Applied Statistics
SN - 0266-4763
IS - 4
ER -