The fault equivalence problem in programmable logic arrays (PLAs) is introduced. Some design rules are proposed. Based on the pseudoexhaustive testable PLA structure, a diagnosis algorithm was developed and implemented on a SUN 3/110 workstation in C language. Experimental results show that this design and the algorithm are quite efficient for PLA fault diagnosis.
|Number of pages||4|
|Journal||Proceedings - IEEE International Symposium on Circuits and Systems|
|Publication status||Published - 1990 Dec 1|
|Event||1990 IEEE International Symposium on Circuits and Systems Part 4 (of 4) - New Orleans, LA, USA|
Duration: 1990 May 1 → 1990 May 3
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering