TY - JOUR
T1 - A new GaAs switching device with double-confinement-collector structure
AU - Liu, Wen Chau
AU - Guo, Der Feng
N1 - Funding Information:
Acknowledgements--The authors wish to thank Miss H. R. Sze for her technical assistance during the MBE growth. Part of this study was supported by the National Science Council of the Republic of China under Contract No. NSC80-0404-E006-14.
Copyright:
Copyright 2014 Elsevier B.V., All rights reserved.
PY - 1992/4
Y1 - 1992/4
N2 - A new GaAs switching device with double-confinement-collector structure, prepared by molecular beam epitaxy (MBE), has been fabricated and demonstrated. An S-shaped negative-differential-resistance (NDR) phenomenon, resulting from the impact ionization at the GaAs intrinsic layer and the potential redistribution effect, was observed. The influence of temperature variation on the switching parameters, e.g. switching voltage VS, switching current IS, holding voltage VH and holding current IH, was investigated. From the experimental results, the proposed structure exhibits good potential for microwave and oscillation circuit applications.
AB - A new GaAs switching device with double-confinement-collector structure, prepared by molecular beam epitaxy (MBE), has been fabricated and demonstrated. An S-shaped negative-differential-resistance (NDR) phenomenon, resulting from the impact ionization at the GaAs intrinsic layer and the potential redistribution effect, was observed. The influence of temperature variation on the switching parameters, e.g. switching voltage VS, switching current IS, holding voltage VH and holding current IH, was investigated. From the experimental results, the proposed structure exhibits good potential for microwave and oscillation circuit applications.
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U2 - 10.1016/0038-1101(92)90111-O
DO - 10.1016/0038-1101(92)90111-O
M3 - Article
AN - SCOPUS:0026852587
SN - 0038-1101
VL - 35
SP - 501
EP - 504
JO - Solid State Electronics
JF - Solid State Electronics
IS - 4
ER -