A new grey prediction model for the return material authorization process in the TFT-LCD industry

Der Chiang Li, Chun Wu Yeh, Chien Chih Chen, Yung Tai Wang

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In the era of the short product life cycle, the return materials authorization (RMA) process plays an important role in satisfying customers because sellers have to prepare a certain amount of stock for returning products. Hence, determining how to evaluate the trade-off between over-stock and under-stock to balance cost-cutting and customer satisfaction is worthy of study. In this paper, we reveal a case taken from a leading TFT-LCD (thin film transistor liquid crystal display) maker in Taiwan, where the prepared stock is very likely to go from being hoarded to futility because the life cycle of TFT-LCD products is very short. To overcome the issues of the RMA process in the case company, obtaining the precise sizes of returning defectives in the near future is considered as one of the key tasks. General grey models (GMs) are widely applied to make predictions for this kind of short-term time series data; nevertheless, there still has the possibility of improving its predictions. This study thus proposes a new GM model, called the MTD-GM model, where a mega-trend-diffusion technique is employed to improve estimating the background values in the traditional GM. The experimental results show that the proposed MTD-GM grey model outperforms four other grey models with eight products in the case company data.

Original languageEnglish
Pages (from-to)2149-2160
Number of pages12
JournalInternational Journal of Advanced Manufacturing Technology
Volume96
Issue number5-8
DOIs
Publication statusPublished - 2018 May 1

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Thin film transistors
Liquid crystal displays
Industry
Life cycle
Customer satisfaction
Time series

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Software
  • Mechanical Engineering
  • Computer Science Applications
  • Industrial and Manufacturing Engineering

Cite this

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A new grey prediction model for the return material authorization process in the TFT-LCD industry. / Li, Der Chiang; Yeh, Chun Wu; Chen, Chien Chih; Wang, Yung Tai.

In: International Journal of Advanced Manufacturing Technology, Vol. 96, No. 5-8, 01.05.2018, p. 2149-2160.

Research output: Contribution to journalArticle

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