A new heterodyne polariscope for the complete optical parameter measurements in a multiple-order waveplate

Yu Tsan Jeng; Yu-Lung Lo

A new heterodyne polariscope for the complete optical parameter measurements in a multiple-order waveplate

Department of Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

To measure the complete optical parameters of linear birefringence materials, a new heterodyne polariscope with sequential measurement method is proposed. In this study, a multiple-order crystalline quartz quarter-waveplate used as a test sample is measured by two sequential setups. The proposed method has average absolute errors of 0.2167° and 0.15 % with respect to the principal axis angle and the phase retardation. The order, thickness and refractive indices also have a good agreement with the known sample data. Compared to its conventional counterparts, the proposed heterodyne polariscope has strong point uniquely on the complete optical parameter measurements.

Original language	English
Title of host publication	Proceedings of the 2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics
Pages	1515-1522
Number of pages	8
Publication status	Published - 2005
Event	2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics - Portland, OR, United States Duration: 2005 Jun 7 → 2005 Jun 9

Other

Other	2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics
Country	United States
City	Portland, OR
Period	05-06-07 → 05-06-09

All Science Journal Classification (ASJC) codes

Engineering(all)

Fingerprint Dive into the research topics of 'A new heterodyne polariscope for the complete optical parameter measurements in a multiple-order waveplate'. Together they form a unique fingerprint.

Cite this

@inproceedings{014eef0699474df9a13aeffdda4bfe1c,

title = "A new heterodyne polariscope for the complete optical parameter measurements in a multiple-order waveplate",

abstract = "To measure the complete optical parameters of linear birefringence materials, a new heterodyne polariscope with sequential measurement method is proposed. In this study, a multiple-order crystalline quartz quarter-waveplate used as a test sample is measured by two sequential setups. The proposed method has average absolute errors of 0.2167° and 0.15 % with respect to the principal axis angle and the phase retardation. The order, thickness and refractive indices also have a good agreement with the known sample data. Compared to its conventional counterparts, the proposed heterodyne polariscope has strong point uniquely on the complete optical parameter measurements.",

author = "Jeng, {Yu Tsan} and Yu-Lung Lo",

year = "2005",

language = "English",

isbn = "0912053909",

pages = "1515--1522",

booktitle = "Proceedings of the 2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics",

note = "2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics ; Conference date: 07-06-2005 Through 09-06-2005",

}

Jeng, YT & Lo, Y-L 2005, A new heterodyne polariscope for the complete optical parameter measurements in a multiple-order waveplate. in Proceedings of the 2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics. pp. 1515-1522, 2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics, Portland, OR, United States, 05-06-07.

TY - GEN

T1 - A new heterodyne polariscope for the complete optical parameter measurements in a multiple-order waveplate

AU - Jeng, Yu Tsan

AU - Lo, Yu-Lung

PY - 2005

Y1 - 2005

N2 - To measure the complete optical parameters of linear birefringence materials, a new heterodyne polariscope with sequential measurement method is proposed. In this study, a multiple-order crystalline quartz quarter-waveplate used as a test sample is measured by two sequential setups. The proposed method has average absolute errors of 0.2167° and 0.15 % with respect to the principal axis angle and the phase retardation. The order, thickness and refractive indices also have a good agreement with the known sample data. Compared to its conventional counterparts, the proposed heterodyne polariscope has strong point uniquely on the complete optical parameter measurements.

AB - To measure the complete optical parameters of linear birefringence materials, a new heterodyne polariscope with sequential measurement method is proposed. In this study, a multiple-order crystalline quartz quarter-waveplate used as a test sample is measured by two sequential setups. The proposed method has average absolute errors of 0.2167° and 0.15 % with respect to the principal axis angle and the phase retardation. The order, thickness and refractive indices also have a good agreement with the known sample data. Compared to its conventional counterparts, the proposed heterodyne polariscope has strong point uniquely on the complete optical parameter measurements.

UR - http://www.scopus.com/inward/record.url?scp=32044470423&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=32044470423&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:32044470423

SN - 0912053909

SP - 1515

EP - 1522

BT - Proceedings of the 2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics

T2 - 2005 SEM Annual Conference and Exposition on Experimental and Applied Mechanics

Y2 - 7 June 2005 through 9 June 2005

ER -