TY - GEN
T1 - A new model of binocular stereo vision system
AU - Lin, Psang-Dain
AU - Lu, Chia Hung
AU - Liao, Te Tan
PY - 2002/12/1
Y1 - 2002/12/1
N2 - Two-CCD binocular stereo vision systems are attracting research interest in many important fields such as 3-D coordinate measurement. However, accurate binocular system modeling is difficult because of lack of fundamental imaging formation theory. In this paper, we demonstrate how a binocular stereo vision system can be modeled, in order to measure a 3-D surface, by the invented skew ray tracing method to study the geometric relations between the images of the cameras and the 3-D surface. In order to investigate the overall accuracy and resolution of this system, the influence of infinitesimal camera reading errors on measured coordinate errors is determined by sensitivity analysis. Numerical verification demonstrates that the performance of the proposed system is excellent.
AB - Two-CCD binocular stereo vision systems are attracting research interest in many important fields such as 3-D coordinate measurement. However, accurate binocular system modeling is difficult because of lack of fundamental imaging formation theory. In this paper, we demonstrate how a binocular stereo vision system can be modeled, in order to measure a 3-D surface, by the invented skew ray tracing method to study the geometric relations between the images of the cameras and the 3-D surface. In order to investigate the overall accuracy and resolution of this system, the influence of infinitesimal camera reading errors on measured coordinate errors is determined by sensitivity analysis. Numerical verification demonstrates that the performance of the proposed system is excellent.
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M3 - Conference contribution
AN - SCOPUS:0141650404
SN - 7560317685
T3 - Proceedings of the Second International Symposium on Instrumentation Science and Technology
BT - Proceedings of the Second International Symposium on Instrumentation Science and Technology
A2 - Fan, K.-C.
A2 - Yetai, F.
A2 - Fan, K-.C.
A2 - Yetai, F.
T2 - Proceedings of the International Symposium on Precision Mechanical Measurement
Y2 - 11 August 2002 through 16 August 2002
ER -