A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET

Te Kuang Chiang, Ying Wen Ko, Hong Wun Gao, Yeong Her Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

On the basis of the quasi-three-dimensional scaling equation and minimum central potential, a new short-channel-effect-degraded subthreshold behavior model for Gate-All-Around (GAA) MOSFET with elliptical cross section is presented. In comparison to the counterpart of conventional FinFET, Elliptical GAA MOSFET not only provides stronger field confinement, but also enhances the immunity to SCEs due to its shorter scaling length. Besides, both threshold voltage roll-off ΔVTH and subthreshold swing roll-up ΔSS can be well controlled by the scaling theory. With its computational efficiency and simple form, the model can be easily used for the circuit application of the Elliptical GAA MOSFET.

Original languageEnglish
Title of host publicationProceedings - 2017 IEEE 12th International Conference on ASIC, ASICON 2017
EditorsYajie Qin, Zhiliang Hong, Ting-Ao Tang
PublisherIEEE Computer Society
Pages520-524
Number of pages5
ISBN (Electronic)9781509066247
DOIs
Publication statusPublished - 2017 Jul 1
Event12th IEEE International Conference on Advanced Semiconductor Integrated Circuits, ASICON 2017 - Guiyang, China
Duration: 2017 Oct 252017 Oct 28

Publication series

NameProceedings of International Conference on ASIC
Volume2017-October
ISSN (Print)2162-7541
ISSN (Electronic)2162-755X

Other

Other12th IEEE International Conference on Advanced Semiconductor Integrated Circuits, ASICON 2017
CountryChina
CityGuiyang
Period17-10-2517-10-28

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Chiang, T. K., Ko, Y. W., Gao, H. W., & Wang, Y. H. (2017). A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET. In Y. Qin, Z. Hong, & T-A. Tang (Eds.), Proceedings - 2017 IEEE 12th International Conference on ASIC, ASICON 2017 (pp. 520-524). (Proceedings of International Conference on ASIC; Vol. 2017-October). IEEE Computer Society. https://doi.org/10.1109/ASICON.2017.8252527