A non-linear quality improvement model using SVR for manufacturing TFT-LCDs

Der Chiang Li, Wen Chih Chen, Chiao Wen Liu, Yao San Lin

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

Thin Film Transistor-Liquid Crystal Displays (TFT-LCDs) are widely used in TVs, monitors, and PDAs. The key process of producing a TFT-LCD is using alignment to combine a Thin Film Transistor (TFT) panel with a Color Filter (CF) panel, which is called celling. The defined cell vernier, which indicates the alignment error, is an important quality index in the manufacturing process. In the CF manufacturing process, the cell vernier is difficult to control because it depends on six TPEs (Total Pitch Errors), with each TPE highly dependent on the others. This paper aims to improve the cell vernier forecasting model with the six TPE attributes to enhance the production yield in the CFmanufacturing process. Using the six dependent variables, this study found that the SVR(SupportVector Machine for Regression) model is the fittest for generating quality results that meet the designed specifications.

Original languageEnglish
Pages (from-to)835-844
Number of pages10
JournalJournal of Intelligent Manufacturing
Volume23
Issue number3
DOIs
Publication statusPublished - 2012 Jun 1

All Science Journal Classification (ASJC) codes

  • Software
  • Industrial and Manufacturing Engineering
  • Artificial Intelligence

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