A novel 3-TFT voltage driving method of compensating VTH shift for a-Si:H TFT and OLED degradation for AMOLED

Chih Lung Lin; Kuan Wen Chou; Fu Chieh Chang; Chia Che Hung

doi:10.1016/j.sse.2011.07.005

A novel 3-TFT voltage driving method of compensating V_TH shift for a-Si:H TFT and OLED degradation for AMOLED

Chih Lung Lin, Kuan Wen Chou, Fu Chieh Chang, Chia Che Hung

Department of Electrical Engineering

Research output: Contribution to journal › Article

2 Citations (Scopus)

Abstract

This work demonstrates the feasibility of a novel pixel circuit by using three a-Si:H TFTs. The proposed circuit can stabilize the OLED current and provide an additional driving current to ameliorate the brightness degradation of the AMOLED. Measurement results indicate that the current degradation of the proposed circuit, caused by V_TH variations, is less than 5% over more than 50,000 s at 60 °C, whereas that of a conventional 2T1C pixel circuit is larger than 34%. Furthermore, to ameliorate the decrease in luminance owing to the OLED degradation, the OLED current can be increased by 10% by analyzing the current degradation and modulating the detected voltage appropriately.

Original language	English
Pages (from-to)	10-13
Number of pages	4
Journal	Solid-State Electronics
Volume	64
Issue number	1
DOIs	https://doi.org/10.1016/j.sse.2011.07.005
Publication status	Published - 2011 Oct 1

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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10.1016/j.sse.2011.07.005

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Lin, C. L., Chou, K. W., Chang, F. C., & Hung, C. C. (2011). A novel 3-TFT voltage driving method of compensating V_TH shift for a-Si:H TFT and OLED degradation for AMOLED. Solid-State Electronics, 64(1), 10-13. https://doi.org/10.1016/j.sse.2011.07.005

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abstract = "This work demonstrates the feasibility of a novel pixel circuit by using three a-Si:H TFTs. The proposed circuit can stabilize the OLED current and provide an additional driving current to ameliorate the brightness degradation of the AMOLED. Measurement results indicate that the current degradation of the proposed circuit, caused by VTH variations, is less than 5% over more than 50,000 s at 60 °C, whereas that of a conventional 2T1C pixel circuit is larger than 34%. Furthermore, to ameliorate the decrease in luminance owing to the OLED degradation, the OLED current can be increased by 10% by analyzing the current degradation and modulating the detected voltage appropriately.",

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