A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

Yao Jen Chuang, Hsin Hung Ou, Bin-Da Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

20 Citations (Scopus)

Abstract

A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.

Original languageEnglish
Title of host publication2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Pages315-318
Number of pages4
DOIs
Publication statusPublished - 2005 Dec 1
Event2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) - Hsinchu, Taiwan
Duration: 2005 Apr 272005 Apr 29

Publication series

Name2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Volume2005

Other

Other2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
CountryTaiwan
CityHsinchu
Period05-04-2705-04-29

Fingerprint

Thermometers
ROM
Networks (circuits)
Binary codes

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Chuang, Y. J., Ou, H. H., & Liu, B-D. (2005). A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. In 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) (pp. 315-318). [1500084] (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); Vol. 2005). https://doi.org/10.1109/VDAT.2005.1500084
Chuang, Yao Jen ; Ou, Hsin Hung ; Liu, Bin-Da. / A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT). 2005. pp. 315-318 (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)).
@inproceedings{c11bb0c333794ad58c2b74831f0f25fb,
title = "A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter",
abstract = "A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.",
author = "Chuang, {Yao Jen} and Ou, {Hsin Hung} and Bin-Da Liu",
year = "2005",
month = "12",
day = "1",
doi = "10.1109/VDAT.2005.1500084",
language = "English",
isbn = "0780390601",
series = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)",
pages = "315--318",
booktitle = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)",

}

Chuang, YJ, Ou, HH & Liu, B-D 2005, A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. in 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)., 1500084, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT), vol. 2005, pp. 315-318, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT), Hsinchu, Taiwan, 05-04-27. https://doi.org/10.1109/VDAT.2005.1500084

A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. / Chuang, Yao Jen; Ou, Hsin Hung; Liu, Bin-Da.

2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT). 2005. p. 315-318 1500084 (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); Vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

AU - Chuang, Yao Jen

AU - Ou, Hsin Hung

AU - Liu, Bin-Da

PY - 2005/12/1

Y1 - 2005/12/1

N2 - A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.

AB - A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.

UR - http://www.scopus.com/inward/record.url?scp=33745457400&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33745457400&partnerID=8YFLogxK

U2 - 10.1109/VDAT.2005.1500084

DO - 10.1109/VDAT.2005.1500084

M3 - Conference contribution

AN - SCOPUS:33745457400

SN - 0780390601

SN - 9780780390607

T3 - 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)

SP - 315

EP - 318

BT - 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)

ER -

Chuang YJ, Ou HH, Liu B-D. A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. In 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT). 2005. p. 315-318. 1500084. (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)). https://doi.org/10.1109/VDAT.2005.1500084