A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

Yao Jen Chuang, Hsin Hung Ou, Bin-Da Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Citations (Scopus)

Abstract

A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.

Original languageEnglish
Title of host publication2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Pages315-318
Number of pages4
DOIs
Publication statusPublished - 2005 Dec 1
Event2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) - Hsinchu, Taiwan
Duration: 2005 Apr 272005 Apr 29

Publication series

Name2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Volume2005

Other

Other2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
CountryTaiwan
CityHsinchu
Period05-04-2705-04-29

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Chuang, Y. J., Ou, H. H., & Liu, B-D. (2005). A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. In 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) (pp. 315-318). [1500084] (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); Vol. 2005). https://doi.org/10.1109/VDAT.2005.1500084