A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

Yao Jen Chuang; Hsin Hung Ou; Bin Da Liu

doi:10.1109/VDAT.2005.1500084

A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

Yao Jen Chuang, Hsin Hung Ou, Bin Da Liu

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

28 Citations (Scopus)

Abstract

A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.

Original language	English
Title of host publication	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Pages	315-318
Number of pages	4
DOIs	https://doi.org/10.1109/VDAT.2005.1500084
Publication status	Published - 2005
Event	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) - Hsinchu, Taiwan Duration: 2005 Apr 27 → 2005 Apr 29

Publication series

Name	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Volume	2005

Other

Other	2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Country/Territory	Taiwan
City	Hsinchu
Period	05-04-27 → 05-04-29

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

10.1109/VDAT.2005.1500084

Cite this

Chuang, Y. J., Ou, H. H., & Liu, B. D. (2005). A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. In 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) (pp. 315-318). [1500084] (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); Vol. 2005). https://doi.org/10.1109/VDAT.2005.1500084

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title = "A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter",

abstract = "A thermometer-to-binary encoder which is suitable for high-speed and low-resolution flash-ADC is proposed. The encoding scheme can effectively reduce the bubble induced error, by the use of separated one-out-of-N circuit for each bit of binary codes. In comparison with the most commonly adopted Gray-ROM encoder, the proposed method can outperform it by a factor of 2 in the bubble error reduction. The long latency gray-to-binary encoder which limits the total conversion speed can also be removed from the proposed circuit, Two types of implementation circuit including a ROM-based encoder and a fully digital encoder are developed.",

author = "Chuang, {Yao Jen} and Ou, {Hsin Hung} and Liu, {Bin Da}",

year = "2005",

doi = "10.1109/VDAT.2005.1500084",

language = "English",

isbn = "0780390601",

series = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)",

pages = "315--318",

booktitle = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)",

note = "2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) ; Conference date: 27-04-2005 Through 29-04-2005",

}

Chuang, YJ, Ou, HH & Liu, BD 2005, A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. in 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)., 1500084, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT), vol. 2005, pp. 315-318, 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT), Hsinchu, Taiwan, 05-04-27. https://doi.org/10.1109/VDAT.2005.1500084

A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter. / Chuang, Yao Jen; Ou, Hsin Hung; Liu, Bin Da.

2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT). 2005. p. 315-318 1500084 (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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A novel bubble tolerant thermometer-to-binary encoder for flash A/D converter

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