A novel method for representing industrial inspection pattern

Yung-Nien Sun, Ching Tsorng Tsai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A. M. Darwish and A. K. Jain (1988). The reduced complexity is approximately 1/K2 of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.

Original languageEnglish
Title of host publication90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90
PublisherPubl by IEEE
Pages596-600
Number of pages5
ISBN (Print)0879425563
Publication statusPublished - 1990 Dec 1
Event1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90 - Hong Kong
Duration: 1990 Sep 241990 Sep 27

Publication series

Name90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90

Other

Other1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90
CityHong Kong
Period90-09-2490-09-27

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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