A novel method for representing industrial inspection pattern

Yung-Nien Sun; Ching Tsorng Tsai

A novel method for representing industrial inspection pattern

Department of Computer Science and Information Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A. M. Darwish and A. K. Jain (1988). The reduced complexity is approximately 1/K² of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.

Original language	English
Title of host publication	90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90
Publisher	Publ by IEEE
Pages	596-600
Number of pages	5
ISBN (Print)	0879425563
Publication status	Published - 1990 Dec 1
Event	1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90 - Hong Kong Duration: 1990 Sep 24 → 1990 Sep 27

Publication series

Name	90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90

Other

Other	1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90
City	Hong Kong
Period	90-09-24 → 90-09-27

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

Fingerprint Dive into the research topics of 'A novel method for representing industrial inspection pattern'. Together they form a unique fingerprint.

Cite this

@inproceedings{c9063173e6e747a8836896bc2b7b158d,

title = "A novel method for representing industrial inspection pattern",

abstract = "A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A. M. Darwish and A. K. Jain (1988). The reduced complexity is approximately 1/K2 of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.",

author = "Yung-Nien Sun and Tsai, {Ching Tsorng}",

year = "1990",

month = dec,

day = "1",

language = "English",

isbn = "0879425563",

series = "90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90",

publisher = "Publ by IEEE",

pages = "596--600",

booktitle = "90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90",

note = "1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90 ; Conference date: 24-09-1990 Through 27-09-1990",

}

TY - GEN

T1 - A novel method for representing industrial inspection pattern

AU - Sun, Yung-Nien

AU - Tsai, Ching Tsorng

PY - 1990/12/1

Y1 - 1990/12/1

N2 - A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A. M. Darwish and A. K. Jain (1988). The reduced complexity is approximately 1/K2 of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.

AB - A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A. M. Darwish and A. K. Jain (1988). The reduced complexity is approximately 1/K2 of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.

UR - http://www.scopus.com/inward/record.url?scp=0025552496&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025552496&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0025552496

SN - 0879425563

T3 - 90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90

SP - 596

EP - 600

BT - 90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90

PB - Publ by IEEE

T2 - 1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90

Y2 - 24 September 1990 through 27 September 1990

ER -