TY - GEN
T1 - A novel method for representing industrial inspection pattern
AU - Sun, Yung Nien
AU - Tsai, Ching Tsorng
PY - 1990
Y1 - 1990
N2 - A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A. M. Darwish and A. K. Jain (1988). The reduced complexity is approximately 1/K2 of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.
AB - A critical step in industrial pattern inspection is to design an effective and flexible method for representing the inspected pattern. The authors propose a novel representation method called pattern attributed hypergraph (PAHG). The PAHG is used to describe the pictorial information of the input pattern, which includes attributed nodes, connectivity between nodes (intrarelation), regional primitives, and neighborhood relations between regions (spatial interrelation). It is found that the complexity of graph matching with the PAHG structure is much lower than the corresponding complexity of the graph structure used by A. M. Darwish and A. K. Jain (1988). The reduced complexity is approximately 1/K2 of the original, where K is the number of regions in the inspected pattern. It provides a better and faster approach for industrial pattern inspection.
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M3 - Conference contribution
AN - SCOPUS:0025552496
SN - 0879425563
T3 - 90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90
SP - 596
EP - 600
BT - 90 IEEE Reg 10 Conf Comput Commun Syst IEEE TENCON 90
PB - Publ by IEEE
T2 - 1990 IEEE Region 10 Conference on Computer and Communication Systems - IEEE TENCON '90
Y2 - 24 September 1990 through 27 September 1990
ER -