A parallel built-in self-diagnosis scheme for embedded memory

Cheng-Wen Wu, L.-M. Denq, R.-F. Huang, Y.-J. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication14th VLSI Design/CAD Symposium
Place of PublicationHualien
Publication statusPublished - 2003 Aug

Cite this

Wu, C-W., Denq, L-M., Huang, R-F., & Chang, Y-J. (2003). A parallel built-in self-diagnosis scheme for embedded memory. In 14th VLSI Design/CAD Symposium