| Original language | English |
|---|---|
| Title of host publication | 14th VLSI Design/CAD Symposium |
| Place of Publication | Hualien |
| Publication status | Published - 2003 Aug |
A parallel built-in self-diagnosis scheme for embedded memory
Cheng-Wen Wu, L.-M. Denq, R.-F. Huang, Y.-J. Chang
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution