TY - GEN
T1 - A Physically Unclonable Function Embedded in a SAR ADC
AU - Chen, Yi Ying
AU - Chang, Soon Jyh
N1 - Funding Information:
This work was supported by Ministry of Science and Technology of Taiwan under grant MOST-110-2218-E-006-021.
Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - This paper presents a physical unclonable function (PUF) embedded in a 10-bit successive-approximation register (SAR) analog-to-digital converter (ADC). There are two operation modes in this design: PUF mode and ADC mode. In the PUF mode, this design realizes the physically unclonable function by manipulating the capacitor array in the SAR ADC. Only a little area overhead is required for implementing the PUF. An offset cancellation circuit is employed to improve the uniformity of the PUF design. The proposed PUF is authenticated using Challenge Response Pairs (CRPs). Reliability and Uniqueness of the CRPs are 97.69% and 48.01%, respectively. Uniformity of the CRPs is 50.59% that is very close to the ideal value of 50%. In the ADC mode, this design achieves an ENOB of 9.66 under 20 MS/s.
AB - This paper presents a physical unclonable function (PUF) embedded in a 10-bit successive-approximation register (SAR) analog-to-digital converter (ADC). There are two operation modes in this design: PUF mode and ADC mode. In the PUF mode, this design realizes the physically unclonable function by manipulating the capacitor array in the SAR ADC. Only a little area overhead is required for implementing the PUF. An offset cancellation circuit is employed to improve the uniformity of the PUF design. The proposed PUF is authenticated using Challenge Response Pairs (CRPs). Reliability and Uniqueness of the CRPs are 97.69% and 48.01%, respectively. Uniformity of the CRPs is 50.59% that is very close to the ideal value of 50%. In the ADC mode, this design achieves an ENOB of 9.66 under 20 MS/s.
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U2 - 10.1109/ITCAsia55616.2022.00025
DO - 10.1109/ITCAsia55616.2022.00025
M3 - Conference contribution
AN - SCOPUS:85143176866
T3 - Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022
SP - 85
EP - 89
BT - Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 6th IEEE International Test Conference in Asia, ITC-Asia 2022
Y2 - 24 August 2022 through 26 August 2022
ER -