A prototype of a wireless-based test system

Jing Jia Liou, Chih Tsun Huang, Cheng Wen Wu, Ching Cheng Tien, Chih Hu Wang, Hsi Pin Ma, Ying Yen Chen, Yueh Chih Hsu, Li Ming Deng, Chien Jung Chiu, Young Wey Li, Chieh Ming Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.

Original languageEnglish
Title of host publicationProceedings - 20th Anniversary IEEE International SOC Conference
Pages225-228
Number of pages4
DOIs
Publication statusPublished - 2007 Dec 1
Event20th Anniversary IEEE International SOC Conference - Hsinchu, Taiwan
Duration: 2007 Sep 262007 Sep 29

Publication series

NameProceedings - 20th Anniversary IEEE International SOC Conference

Other

Other20th Anniversary IEEE International SOC Conference
CountryTaiwan
CityHsinchu
Period07-09-2607-09-29

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A prototype of a wireless-based test system'. Together they form a unique fingerprint.

  • Cite this

    Liou, J. J., Huang, C. T., Wu, C. W., Tien, C. C., Wang, C. H., Ma, H. P., Chen, Y. Y., Hsu, Y. C., Deng, L. M., Chiu, C. J., Li, Y. W., & Chang, C. M. (2007). A prototype of a wireless-based test system. In Proceedings - 20th Anniversary IEEE International SOC Conference (pp. 225-228). [4545463] (Proceedings - 20th Anniversary IEEE International SOC Conference). https://doi.org/10.1109/SOCC.2007.4545463