A prototype of a wireless-based test system

Jing Jia Liou; Chih Tsun Huang; Cheng Wen Wu; Ching Cheng Tien; Chih Hu Wang; Hsi Pin Ma; Ying Yen Chen; Yueh Chih Hsu; Li Ming Deng; Chien Jung Chiu; Young Wey Li; Chieh Ming Chang

doi:10.1109/SOCC.2007.4545463

A prototype of a wireless-based test system

Jing Jia Liou
, Chih Tsun Huang
, Cheng Wen Wu
, Ching Cheng Tien
, Chih Hu Wang
, Hsi Pin Ma
, Ying Yen Chen
, Yueh Chih Hsu
, Li Ming Deng
, Chien Jung Chiu
, Young Wey Li
, Chieh Ming Chang

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Citations (Scopus)

Abstract

In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.

Original language	English
Title of host publication	Proceedings - 20th Anniversary IEEE International SOC Conference
Pages	225-228
Number of pages	4
DOIs	https://doi.org/10.1109/SOCC.2007.4545463
Publication status	Published - 2007 Dec 1
Event	20th Anniversary IEEE International SOC Conference - Hsinchu, Taiwan Duration: 2007 Sept 26 → 2007 Sept 29

Publication series

Name	Proceedings - 20th Anniversary IEEE International SOC Conference

Other

Other	20th Anniversary IEEE International SOC Conference
Country/Territory	Taiwan
City	Hsinchu
Period	07-09-26 → 07-09-29

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/SOCC.2007.4545463

Cite this

Liou, J. J., Huang, C. T., Wu, C. W., Tien, C. C., Wang, C. H., Ma, H. P., Chen, Y. Y., Hsu, Y. C., Deng, L. M., Chiu, C. J., Li, Y. W., & Chang, C. M. (2007). A prototype of a wireless-based test system. In Proceedings - 20th Anniversary IEEE International SOC Conference (pp. 225-228). Article 4545463 (Proceedings - 20th Anniversary IEEE International SOC Conference). https://doi.org/10.1109/SOCC.2007.4545463

@inproceedings{b4ece68ce62742c68d57d06cfc642d45,

title = "A prototype of a wireless-based test system",

abstract = "In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.",

author = "Liou, \{Jing Jia\} and Huang, \{Chih Tsun\} and Wu, \{Cheng Wen\} and Tien, \{Ching Cheng\} and Wang, \{Chih Hu\} and Ma, \{Hsi Pin\} and Chen, \{Ying Yen\} and Hsu, \{Yueh Chih\} and Deng, \{Li Ming\} and Chiu, \{Chien Jung\} and Li, \{Young Wey\} and Chang, \{Chieh Ming\}",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/SOCC.2007.4545463",

language = "English",

isbn = "9781424415922",

series = "Proceedings - 20th Anniversary IEEE International SOC Conference",

pages = "225--228",

booktitle = "Proceedings - 20th Anniversary IEEE International SOC Conference",

note = "20th Anniversary IEEE International SOC Conference ; Conference date: 26-09-2007 Through 29-09-2007",

}

Liou, JJ, Huang, CT, Wu, CW, Tien, CC, Wang, CH, Ma, HP, Chen, YY, Hsu, YC, Deng, LM, Chiu, CJ, Li, YW & Chang, CM 2007, A prototype of a wireless-based test system. in Proceedings - 20th Anniversary IEEE International SOC Conference., 4545463, Proceedings - 20th Anniversary IEEE International SOC Conference, pp. 225-228, 20th Anniversary IEEE International SOC Conference, Hsinchu, Taiwan, 07-09-26. https://doi.org/10.1109/SOCC.2007.4545463

TY - GEN

T1 - A prototype of a wireless-based test system

AU - Liou, Jing Jia

AU - Huang, Chih Tsun

AU - Wu, Cheng Wen

AU - Tien, Ching Cheng

AU - Wang, Chih Hu

AU - Ma, Hsi Pin

AU - Chen, Ying Yen

AU - Hsu, Yueh Chih

AU - Deng, Li Ming

AU - Chiu, Chien Jung

AU - Li, Young Wey

AU - Chang, Chieh Ming

PY - 2007/12/1

Y1 - 2007/12/1

N2 - In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.

AB - In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.

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U2 - 10.1109/SOCC.2007.4545463

DO - 10.1109/SOCC.2007.4545463

M3 - Conference contribution

AN - SCOPUS:51049116812

SN - 9781424415922

T3 - Proceedings - 20th Anniversary IEEE International SOC Conference

SP - 225

EP - 228

BT - Proceedings - 20th Anniversary IEEE International SOC Conference

T2 - 20th Anniversary IEEE International SOC Conference

Y2 - 26 September 2007 through 29 September 2007

ER -

A prototype of a wireless-based test system

Abstract

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All Science Journal Classification (ASJC) codes

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