A Reliable Near-Threshold Voltage SRAM-Based PUF Utilizing Weight Detection Technique

Lih Yih Chiou, Jing Yu Huang, Chi Kuan Li, Chen Chung Tsai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

With the continuous advancement of technology, security issues have become increasingly important. In the applications of Internet of Things (IoT), millions of IoT devices are designed to collect data that are sensitive or private. It is crucial to secure such devices. Therefore, every vulnerable device needs to be protected during either communication or operation. Physical unclonable function (PUF), which utilizes random variation during the chip manufacturing process, can realize the concept of chip fingerprint. A PUF not only enhances security but also provides a lightweight choice different from the traditional mechanism that requires a huge amount of storage. In this paper, a reliable near-threshold voltage SRAM-based PUF is designed and presented. The proposed near-threshold design not only achieves 98.055% reliability and 49.99% uniqueness but also consumes lower energy when compared with other works.

Original languageEnglish
Title of host publication2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665419154
DOIs
Publication statusPublished - 2021 Apr 19
Event2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021 - Hsinchu, Taiwan
Duration: 2021 Apr 192021 Apr 22

Publication series

Name2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021 - Proceedings

Conference

Conference2021 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021
Country/TerritoryTaiwan
CityHsinchu
Period21-04-1921-04-22

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality
  • Instrumentation
  • Electrical and Electronic Engineering

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