Abstract
Nonvolatile flip-flops (nvFFs) enable frequent-off processors to achieve fast power-off and wake-up time while maintaining critical local computing states through parallel data movement between volatile FFs and local nonvolatile memory (NVM) devices. However, current nvFFs face challenges in large store energy ( \text{E}-{\mathrm {S}} ) and long voltage stress time on the device ( \text{T}-{\mathrm {STRESS}} ), due to wide distribution in the write time of NVM device as well as unnecessary writes. Moreover, heavy parasitic load on the power rail cause long wake-up time for restoring data from NVM to FFs. This paper proposes the resistive RAM (ReRAM)-based nvFF with self-write termination (SWT) and reduced loading on power rail to: 1) reduce 93+% waste of \text{E}-{\mathrm {S}} from fast switching or matched cells; 2) suppress endurance and reliability degradation resulted from overprogramming and long \text{T}-{\mathrm {STRESS}} ; and 3) achieve reliable and 26+ times faster restore operation compared with previous nvFFs. We have fabricated a nonvolatile processor and a test chip with SWT-nvFFs using logic-process ReRAM in a 65-nm CMOS process. Measured results show sub-2-ns termination response time and sub-20-ns chip-level restore time.
Original language | English |
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Article number | 7961232 |
Pages (from-to) | 2194-2207 |
Number of pages | 14 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 52 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2017 Aug |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering