A self-bias Ku-band 1-watt PHEMT power amplifier MMIC with a compact source capacitor

H. Z. Liu, C. H. Lin, C. K. Chu, H. K. Huang, Mau-phon Houng, Yeong-Her Wang, C. H. Chang, C. L. Wu, C. S. Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, the design of a self-bias 1.8 mm AlGaAs/InGaAs/GaAs PHEMT with a compact source capacitor for operation in Ku-band frequency is described. Based on the proposed device, a self-bias Ku-band 1-W two-stage power amplifier MMIC is also demonstrated. Under single bias condition of 8 V and 630 mA, the self-bias MMIC possesses 14.2 dB small-signal gain, 30.2 dBm output power at 1-dB gain compression point with 19.2% power added efficiency and 31.3 dBm saturated output power with 22.5% power added efficiency at 14 GHz. With the performance comparable to the dual-bias MMIC counterpart, the proposed self-bias MMIC is more attractive to system designers on VSAT applications.

Original languageEnglish
Title of host publication2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages207-210
Number of pages4
ISBN (Print)0780393392, 9780780393394
DOIs
Publication statusPublished - 2005 Jan 1
Event2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC - Howloon, Hong Kong
Duration: 2005 Dec 192005 Dec 21

Publication series

Name2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC

Other

Other2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
CountryHong Kong
CityHowloon
Period05-12-1905-12-21

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Liu, H. Z., Lin, C. H., Chu, C. K., Huang, H. K., Houng, M., Wang, Y-H., Chang, C. H., Wu, C. L., & Chang, C. S. (2005). A self-bias Ku-band 1-watt PHEMT power amplifier MMIC with a compact source capacitor. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC (pp. 207-210). [1635242] (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2005.1635242