@inproceedings{0fd54a6fd4594e1b8a03703f5a664f5e,
title = "A self-testing and calibration method for embedded successive approximation register ADC",
abstract = "This paper presents a self-testing and calibration method for the embedded successive approximation register (SAR) analog-to-digital converter (ADC). We first propose a low cost design-for-test (DfT) technique which tests a SAR ADC by characterizing its digital-to-analog converter (DAC) capacitor array. Utilizing DAC major carrier transition testing, the required analog measurement range is just 4 LSBs; this significantly lowers the test circuitry complexity. Then, we develop a fully-digital missing code calibration technique that utilizes the proposed testing scheme to collect the required calibration information. Simulation results are presented to validate the proposed technique.",
author = "Huang, {Xuan Lun} and Kang, {Ping Ying} and Chang, {Hsiu Ming} and Huang, {Jiun Lang} and Chou, {Yung Fa} and Lee, {Yung Pin} and Kwai, {Ding Ming} and Wu, {Cheng Wen}",
year = "2011",
month = mar,
day = "28",
doi = "10.1109/ASPDAC.2011.5722279",
language = "English",
isbn = "9781424475155",
series = "Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC",
pages = "713--718",
booktitle = "2011 16th Asia and South Pacific Design Automation Conference, ASP-DAC 2011",
note = "2011 16th Asia and South Pacific Design Automation Conference, ASP-DAC 2011 ; Conference date: 25-01-2011 Through 28-01-2011",
}