TY - GEN
T1 - A successive approximation ADC with resistor-capacitor hybrid structure
AU - Chen, Ting Zi
AU - Chang, Soon-Jyh
AU - Huang, Guan Ying
PY - 2013/8/15
Y1 - 2013/8/15
N2 - This paper presents a 10-bit 50MS/s successive approximation register (SAR) ADC with low input capacitance that uses an on-chip resistive ladder to arrange a new switching scheme. The proposed arrangement not only reduces the total input capacitance, but also performs the predictive capacitor switching sequence to further reduce the power consumption. Therefore, the proposed SAR ADC has the features of small area and low power consumption. Compared to conventional SAR ADCs, the proposed ADC reduces the input capacitance to 512 fF for 10-bit resolution. This work is fabricated in TSMC 90-nm 1P9M CMOS process. This prototype chip consumes 0.703 mW from a 1.2-V supply and the ENOB is 9.3 bits at 50 MS/s sampling rate. The resultant FoM is 28 fJ/conversion-step.
AB - This paper presents a 10-bit 50MS/s successive approximation register (SAR) ADC with low input capacitance that uses an on-chip resistive ladder to arrange a new switching scheme. The proposed arrangement not only reduces the total input capacitance, but also performs the predictive capacitor switching sequence to further reduce the power consumption. Therefore, the proposed SAR ADC has the features of small area and low power consumption. Compared to conventional SAR ADCs, the proposed ADC reduces the input capacitance to 512 fF for 10-bit resolution. This work is fabricated in TSMC 90-nm 1P9M CMOS process. This prototype chip consumes 0.703 mW from a 1.2-V supply and the ENOB is 9.3 bits at 50 MS/s sampling rate. The resultant FoM is 28 fJ/conversion-step.
UR - http://www.scopus.com/inward/record.url?scp=84881359941&partnerID=8YFLogxK
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U2 - 10.1109/VLDI-DAT.2013.6533842
DO - 10.1109/VLDI-DAT.2013.6533842
M3 - Conference contribution
AN - SCOPUS:84881359941
SN - 9781467344357
T3 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
BT - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
T2 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
Y2 - 22 April 2013 through 24 April 2013
ER -