@inproceedings{98bb89663dc64d6493c48b65d4bee384,
title = "A supply-gating scheme for both data-retention and spike-reduction in power management and test scheduling",
author = "Huang, {Tsung Chu} and Tzeng, {Jing Chi} and Chao, {Yuan Wei} and Chen, {Ji Jan} and Liu, {Wei Ting} and Lee, {Kuen Jong}",
year = "2007",
doi = "10.1109/VDAT.2006.258151",
language = "English",
isbn = "1424401798",
series = "2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers",
pages = "167--170",
booktitle = "2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 - Proceedings of Technical Papers",
note = "2006 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2006 ; Conference date: 26-04-2007 Through 28-04-2007",
}