A systematic approach to reducing semiconductor memory test time in mass production

Jen Chieh Yeh, Shyr Fen Kuo, Cheng Wen Wu, Chih Tsun Huang, Chao Hsun Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Semiconductor memory testing has been a key problem in testing integrated circuits for years. With their growing density and capacity, the test time grows rapidly if the test methodologies and equipments remain the same. Test time reduction other than parallel insertion - which is expensive and more and more difficult to keep up with the memory capacity growth - is a long time research issue, as test cost is directly related to the time each product stays on the tester. In order to solve the test time reduction (TTR) problem, we propose a systematic approach to analyzing and rearranging the test items in the test flow. We propose three test compaction techniques: 1) removing redundant test items, 2) merging existing test patterns, 3) developing efficient new test patterns. The proposed TTR algorithm is shown to effectively reduce the test time of an industrial DRAM product. The TTR tool also can identify the redundant test items, suggest a proper test list, and provide the correlation between the test items. In the industrial case, about 19.5% of the total test time is reduced, on top of the original manually compacted test flow.

Original languageEnglish
Title of host publicationProceedings - 2005 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2005
Pages97-102
Number of pages6
DOIs
Publication statusPublished - 2005 Dec 9
EventProceedings - 2005 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2005 - Taipei, Taiwan
Duration: 2005 Aug 32005 Aug 5

Publication series

NameRecords of the IEEE International Workshop on Memory Technology, Design and Testing
ISSN (Print)1087-4852

Other

OtherProceedings - 2005 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2005
CountryTaiwan
CityTaipei
Period05-08-0305-08-05

All Science Journal Classification (ASJC) codes

  • Media Technology

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