A systematic method to classify scan cells

K. J. Lee, M. H. Lu, J. F. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

A scan cell (S-cell) is a basic storage unit for a scan-based sequential circuit. Depending on different requirements on the circuit under test, many design variations of S-cells exist. In this paper a systematic method to classify all practical S-cells is presented. Based on a novel graph representation and a set of design criteria, we find that all practical S-cells can be classified into 19 schematic structures which can be further divided into 66 different substructures. Among all of these substructures less than 10 have been previously identified and used.

Original languageEnglish
Title of host publicationATS 1993 Proceedings - 2nd Asian Test Symposium
PublisherIEEE Computer Society
Pages219-224
Number of pages6
ISBN (Electronic)081863930X
DOIs
Publication statusPublished - 1993 Jan 1
Event2nd IEEE Asian Test Symposium, ATS 1993 - Beijing, China
Duration: 1993 Nov 161993 Nov 18

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735

Conference

Conference2nd IEEE Asian Test Symposium, ATS 1993
CountryChina
CityBeijing
Period93-11-1693-11-18

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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