TY - GEN
T1 - A systematic method to classify scan cells
AU - Lee, K. J.
AU - Lu, M. H.
AU - Wang, J. F.
N1 - Funding Information:
“I his work was supported in part by the National Science
Publisher Copyright:
© 1993 IEEE.
PY - 1993
Y1 - 1993
N2 - A scan cell (S-cell) is a basic storage unit for a scan-based sequential circuit. Depending on different requirements on the circuit under test, many design variations of S-cells exist. In this paper a systematic method to classify all practical S-cells is presented. Based on a novel graph representation and a set of design criteria, we find that all practical S-cells can be classified into 19 schematic structures which can be further divided into 66 different substructures. Among all of these substructures less than 10 have been previously identified and used.
AB - A scan cell (S-cell) is a basic storage unit for a scan-based sequential circuit. Depending on different requirements on the circuit under test, many design variations of S-cells exist. In this paper a systematic method to classify all practical S-cells is presented. Based on a novel graph representation and a set of design criteria, we find that all practical S-cells can be classified into 19 schematic structures which can be further divided into 66 different substructures. Among all of these substructures less than 10 have been previously identified and used.
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U2 - 10.1109/ATS.1993.398808
DO - 10.1109/ATS.1993.398808
M3 - Conference contribution
AN - SCOPUS:0012175461
T3 - Proceedings of the Asian Test Symposium
SP - 219
EP - 224
BT - ATS 1993 Proceedings - 2nd Asian Test Symposium
PB - IEEE Computer Society
T2 - 2nd IEEE Asian Test Symposium, ATS 1993
Y2 - 16 November 1993 through 18 November 1993
ER -