A test access control and test integration system for system-on-chip

Cheng-Wen Wu, C.-W. Wang, J.-R. Huang, K.-L. Cheng, H.-S. Hsu, C.-T. Huang, Y.-L. Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)
Place of PublicationMonterey, California
Publication statusPublished - 2002 May

Cite this