A test access control and test integration system for system-on-chip

Cheng-Wen Wu, C.-W. Wang, J.-R. Huang, K.-L. Cheng, H.-S. Hsu, C.-T. Huang, Y.-L. Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)
Place of PublicationMonterey, California
Publication statusPublished - 2002 May

Cite this

Wu, C-W., Wang, C-W., Huang, J-R., Cheng, K-L., Hsu, H-S., Huang, C-T., & Lin, Y-L. (2002). A test access control and test integration system for system-on-chip. In 6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)