A test access control and test integration system for system-on-chip

Cheng-Wen Wu, C.-W. Wang, J.-R. Huang, K.-L. Cheng, H.-S. Hsu, C.-T. Huang, Y.-L. Lin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)
Place of Publication	Monterey, California
Publication status	Published - 2002 May

Cite this

@inproceedings{0dd96410070e42e68b5d5edd849b0f99,

title = "A test access control and test integration system for system-on-chip",

author = "Cheng-Wen Wu and C.-W. Wang and J.-R. Huang and K.-L. Cheng and H.-S. Hsu and C.-T. Huang and Y.-L. Lin",

year = "2002",

month = may,

language = "English",

booktitle = "6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)",

}

TY - GEN

T1 - A test access control and test integration system for system-on-chip

AU - Wu, Cheng-Wen

AU - Wang, C.-W.

AU - Huang, J.-R.

AU - Cheng, K.-L.

AU - Hsu, H.-S.

AU - Huang, C.-T.

AU - Lin, Y.-L.

PY - 2002/5

Y1 - 2002/5

M3 - Conference contribution

BT - 6th IEEE Int. Workshop on Testing Embedded Core-Based System-Chips (TECS)

CY - Monterey, California

ER -