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A test controller for system-on-chip designs with test wrappers

  • Cheng-Wen Wu
  • , J.-B. Chen
  • , J.-F. Li
  • , H.-J. Huang
  • , C.-P. Su
  • , C. Cheng
  • , S.-I Chen
  • , C.-Y. Hwang
  • , H.-P. Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication12th VLSI Design/CAD Symposium
Place of PublicationHsinchu
Publication statusPublished - 2001 Aug

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