A test controller for system-on-chip designs with test wrappers

Cheng-Wen Wu, J.-B. Chen, J.-F. Li, H.-J. Huang, C.-P. Su, C. Cheng, S.-I Chen, C.-Y. Hwang, H.-P. Lin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cite this

@inproceedings{fa50769479f24b90b81a76445b66f34d,

title = "A test controller for system-on-chip designs with test wrappers",

author = "Cheng-Wen Wu and J.-B. Chen and J.-F. Li and H.-J. Huang and C.-P. Su and C. Cheng and S.-I Chen and C.-Y. Hwang and H.-P. Lin",

year = "2001",

month = aug,

language = "English",

booktitle = "12th VLSI Design/CAD Symposium",

}