TY - JOUR
T1 - A test program generator for memory systems
AU - Shih, Hung Ju
AU - Ker, Jar Shone
AU - Kuo, Yau Hwang
N1 - Funding Information:
This work was supported by the National Science Council of the Republic of China under Grant NSC81-0404-E006-120.
PY - 1994/3
Y1 - 1994/3
N2 - A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.
AB - A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.
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U2 - 10.1080/02533839.1994.9677581
DO - 10.1080/02533839.1994.9677581
M3 - Article
AN - SCOPUS:0028385456
SN - 0253-3839
VL - 17
SP - 179
EP - 191
JO - Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an
JF - Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an
IS - 2
ER -