A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.
|Number of pages||13|
|Journal||Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an|
|Publication status||Published - 1994 Mar|
All Science Journal Classification (ASJC) codes