A test program generator for memory systems

Hung Ju Shih, Jar Shone Ker, Yau Hwang Kuo

Research output: Contribution to journalArticlepeer-review


A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.

Original languageEnglish
Pages (from-to)179-191
Number of pages13
JournalJournal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an
Issue number2
Publication statusPublished - 1994 Mar

All Science Journal Classification (ASJC) codes

  • Engineering(all)


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