A testability-driven optimizer and wrapper generator for embedded memories

Rei Fu Huang, Li Ming Denq, Cheng Wen Wu, Jin Fu Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Memory cores (especially SRAM cores) used on a system chip usually come from a memory compiler. Commercial memory compilers have their limitation-a large memory may need to be implemented with multiple small memories, if generated by memory compilers. In this paper we introduce a testability-driven memory optimizer and wrapper generator that generates BISTed embedded memories by using a commercial memory compiler. We describe one of its key components called MORE (for Memory Optimization and REconfiguration). The approach is cost effective for designing embedded memories. By configuring small memory cores into the large one specified by the user and providing the BIST circuits, MORE allows the user to combine the commercial memory compiler and our memory BIST compiler into a cost-effective testability-driven memory generator. The resulting memory has a shorter test time, since the small memory cores can be tested in parallel, so far as the power and geometry constraints are considered. As an example, the test time of a typical 256K×32 memory generated by MORE is reduced by about 75%.

Original languageEnglish
Title of host publicationRecords of the 2003 International Workshop on Memory Technology, Design and Testing, MTDT 2003
PublisherIEEE Computer Society
Pages53-56
Number of pages4
ISBN (Electronic)0769520049
DOIs
Publication statusPublished - 2003 Jan 1
EventRecords of the 2003 International Workshop on Memory Technology, Design and Testing, MTDT 2003 - San Jose, United States
Duration: 2003 Jul 282003 Jul 29

Publication series

NameRecords of the IEEE International Workshop on Memory Technology, Design and Testing
Volume2003-January
ISSN (Print)1087-4852

Conference

ConferenceRecords of the 2003 International Workshop on Memory Technology, Design and Testing, MTDT 2003
CountryUnited States
CitySan Jose
Period03-07-2803-07-29

All Science Journal Classification (ASJC) codes

  • Media Technology

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