A Testable/Fault-Tolerant FFT Processor Design

Cheng-Wen Wu, S.-K. Lu, J.-S. Shih

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication9th IEEE Asian Test Symp. (ATS)
Place of PublicationTaipei
Publication statusPublished - 2000 Dec

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