A totally self-checking checker for CMOS stuck-on faults

Y.-R. Shieh, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Computer Symposium (ICS)
Place of PublicationTaichung
Pages1093-1099
Publication statusPublished - 1992 Dec

Cite this