| Original language | English |
|---|---|
| Title of host publication | International Computer Symposium (ICS) |
| Place of Publication | Taichung |
| Pages | 1093-1099 |
| Publication status | Published - 1992 Dec |
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A totally self-checking checker for CMOS stuck-on faults
Y.-R. Shieh, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution