Fingerprint
Dive into the research topics of 'A transient capacitance study of radiation‐induced defects in aluminum‐doped silicon'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A transient capacitance study of radiation‐induced defects in aluminum‐doped silicon
Y. H. Lee, K. L. Wang, A. Jaworowski, P. M. Mooney, L. J. Cheng, J. W. Corbett
Research output: Contribution to journal › Article › peer-review
22
Citations
(Scopus)