@inproceedings{0c953416d1c04fd49930566f347df27c,
title = "A universal March pattern generator for testing embedded memory cores",
abstract = "In this paper we present a systematic procedure to integrate multiple march algorithms into a universal embedded test pattern generator to test the various kinds of memory cores in a system-on-a-chip. With a low hardware overhead, a satisfied high fault coverage can be achieved by using the proposed test pattern generator.",
author = "Wang, {Wei Lun} and Lee, {Kuen Jong} and Wang, {Jhing Fa}",
note = "Publisher Copyright: {\textcopyright} 1999 IEEE.; 12th Annual IEEE International ASIC/SOC Conference ; Conference date: 15-09-1999 Through 18-09-1999",
year = "1999",
doi = "10.1109/ASIC.1999.806510",
language = "English",
series = "Proceedings - 12th Annual IEEE International ASIC/SOC Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "228--232",
booktitle = "Proceedings - 12th Annual IEEE International ASIC/SOC Conference",
address = "United States",
}