Absolute calibration of space-resolving soft X-ray spectrograph for plasma diagnostics

M. Yoshikawa, Y. Okamoto, E. Kawamori, Y. Watanabe, C. Watabe, N. Yamaguchi, T. Tamano

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

A grazing incidence flat-field soft X-ray (20-350 Å) spectrograph was constructed and applied for impurity diagnostics in the GAMMA 10 fusion plasma. The spectrograph consisted of a limited height entrance slit, an aberration-corrected concave grating, a microchannel-plate intensified detector and an instant camera/a high speed solid state camera. An absolute calibration experiment for the SX spectrograph was performed at the Photon Factory in the High Energy Accelerator Research Organization with monitoring the incident synchrotron beam intensity by using an absolutely calibrated XUV silicon photodiode. From the results of absolute calibration of the spectrograph, the radiation loss from the plasma was obtained.

Original languageEnglish
Pages (from-to)1533-1536
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume467-468
Issue numberPART II
DOIs
Publication statusPublished - 2001 Jan 1

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Fingerprint Dive into the research topics of 'Absolute calibration of space-resolving soft X-ray spectrograph for plasma diagnostics'. Together they form a unique fingerprint.

  • Cite this