Accelerated destructive degradation tests robust to distribution misspecification

Shuen-Lin Jeng, Bei Ying Huang, William Q. Meeker

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Accelerated repeated-measures degradation tests (ARMDTs) take measurements of degradation or performance on a sample of units over time. In certain products, measurements are destructive, leading to accelerated destructive degradation test (ADDT) data. For example, the test of an adhesive bond needs to break the test specimen to measure the strength of the bond. Lognormal and Weibull distributions are often used to describe the distribution of product characteristics in life and degradation tests. When the distribution is misspecified, the lifetime quantile, often of interest to the practitioner, may differ significantly between these two distributions. In this study, under a specific ADDT, we investigate the bias and variance due to distribution misspecification. We suggest robust test plans under the criteria of minimizing the approximate mean square error.

Original languageEnglish
Article number5953546
Pages (from-to)701-711
Number of pages11
JournalIEEE Transactions on Reliability
Volume60
Issue number4
DOIs
Publication statusPublished - 2011 Dec 1

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Degradation
Weibull distribution
Mean square error
Adhesives

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

Cite this

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Accelerated destructive degradation tests robust to distribution misspecification. / Jeng, Shuen-Lin; Huang, Bei Ying; Meeker, William Q.

In: IEEE Transactions on Reliability, Vol. 60, No. 4, 5953546, 01.12.2011, p. 701-711.

Research output: Contribution to journalArticle

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