TY - JOUR
T1 - Accelerated life tests for weibull series systems with masked data
AU - Fan, Tsai Hung
AU - Wang, Wan Lun
N1 - Funding Information:
Manuscript received December 14, 2009; revised July 16, 2010; accepted December 06, 2010. Date of publication April 21, 2011; date of current version August 31, 2011. This work was supported in part by the National Science Council of Taiwan under Grants NSC 96-2118-M-008-001-MY2 and NSC 99-2118-M-035-004. Associate Editor: R. H. Yeh.
PY - 2011/9
Y1 - 2011/9
N2 - This article introduces a p-stage step-stress accelerated life test on n system products, where each system contains m s-independent non-identical components connected in series, and it fails if any component has broken down. Due to cost considerations or environmental restrictions, masked causes of system failures and type-I censored observations might occur in the collected data. The time to failure under a pre-specified stress environment is described by a Weibull-distributed cumulative exposure model. A computationally feasible procedure based on the hybrid EM-NR algorithm is developed for maximum likelihood estimation of the model. Further, the reliability of the system and components are estimated at a specified time under usual operating conditions. The proposed method is illustrated through a numerical example and a simulation study under various masking levels.
AB - This article introduces a p-stage step-stress accelerated life test on n system products, where each system contains m s-independent non-identical components connected in series, and it fails if any component has broken down. Due to cost considerations or environmental restrictions, masked causes of system failures and type-I censored observations might occur in the collected data. The time to failure under a pre-specified stress environment is described by a Weibull-distributed cumulative exposure model. A computationally feasible procedure based on the hybrid EM-NR algorithm is developed for maximum likelihood estimation of the model. Further, the reliability of the system and components are estimated at a specified time under usual operating conditions. The proposed method is illustrated through a numerical example and a simulation study under various masking levels.
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U2 - 10.1109/TR.2011.2134270
DO - 10.1109/TR.2011.2134270
M3 - Article
AN - SCOPUS:80052396228
SN - 0018-9529
VL - 60
SP - 557
EP - 569
JO - IEEE Transactions on Reliability
JF - IEEE Transactions on Reliability
IS - 3
M1 - 5753980
ER -