Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector

S. S. Hullavarad, I. Takeuchi, J. Berger, S. Dhar, K. S. Chang, T. Venkatesan, T. C. Loughran, R. D. Vispute, S. N. Yedave

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.

Original languageEnglish
Pages (from-to)495-499
Number of pages5
JournalMaterials Research Society Symposium - Proceedings
Volume785
DOIs
Publication statusPublished - 2003
EventMaterials and Devices for Smart Systems - Boston, MA, United States
Duration: 2003 Dec 12003 Dec 5

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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