Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector

S. S. Hullavarad; I. Takeuchi; J. Berger; S. Dhar; K. S. Chang; T. Venkatesan; T. C. Loughran; R. D. Vispute; S. N. Yedave

doi:10.1557/proc-785-d14.5

Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector

S. S. Hullavarad, I. Takeuchi, J. Berger, S. Dhar, K. S. Chang, T. Venkatesan, T. C. Loughran, R. D. Vispute, S. N. Yedave

Department of Materials Science and Engineering

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.

Original language	English
Pages (from-to)	495-499
Number of pages	5
Journal	Materials Research Society Symposium - Proceedings
Volume	785
DOIs	https://doi.org/10.1557/proc-785-d14.5
Publication status	Published - 2003
Event	Materials and Devices for Smart Systems - Boston, MA, United States Duration: 2003 Dec 1 → 2003 Dec 5

All Science Journal Classification (ASJC) codes

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1557/proc-785-d14.5

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title = "Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector",

abstract = "In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.",

author = "Hullavarad, {S. S.} and I. Takeuchi and J. Berger and S. Dhar and Chang, {K. S.} and T. Venkatesan and Loughran, {T. C.} and Vispute, {R. D.} and Yedave, {S. N.}",

year = "2003",

doi = "10.1557/proc-785-d14.5",

language = "English",

volume = "785",

pages = "495--499",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Materials and Devices for Smart Systems ; Conference date: 01-12-2003 Through 05-12-2003",

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TY - JOUR

T1 - Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector

AU - Hullavarad, S. S.

AU - Takeuchi, I.

AU - Berger, J.

AU - Dhar, S.

AU - Chang, K. S.

AU - Venkatesan, T.

AU - Loughran, T. C.

AU - Vispute, R. D.

AU - Yedave, S. N.

PY - 2003

Y1 - 2003

N2 - In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.

AB - In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.

UR - http://www.scopus.com/inward/record.url?scp=2942635770&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=2942635770&partnerID=8YFLogxK

U2 - 10.1557/proc-785-d14.5

DO - 10.1557/proc-785-d14.5

M3 - Conference article

AN - SCOPUS:2942635770

SN - 0272-9172

VL - 785

SP - 495

EP - 499

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Materials and Devices for Smart Systems

Y2 - 1 December 2003 through 5 December 2003

ER -

Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector

Abstract

All Science Journal Classification (ASJC) codes

UN SDGs

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