Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector

S. S. Hullavarad, I. Takeuchi, J. Berger, S. Dhar, Kao-Shuo Chang, T. Venkatesan, T. C. Loughran, R. D. Vispute, S. N. Yedave

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.

Original languageEnglish
Pages (from-to)495-499
Number of pages5
JournalMaterials Research Society Symposium - Proceedings
Volume785
Publication statusPublished - 2003 Dec 1
EventMaterials and Devices for Smart Systems - Boston, MA, United States
Duration: 2003 Dec 12003 Dec 5

Fingerprint

Ultraviolet detectors
Quartz
Aluminum Oxide
detectors
Pulsed laser deposition
Sapphire
pulsed laser deposition
sapphire
quartz
Glass
glass
Testing
Substrates
Chemical analysis

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Hullavarad, S. S., Takeuchi, I., Berger, J., Dhar, S., Chang, K-S., Venkatesan, T., ... Yedave, S. N. (2003). Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector. Materials Research Society Symposium - Proceedings, 785, 495-499.
Hullavarad, S. S. ; Takeuchi, I. ; Berger, J. ; Dhar, S. ; Chang, Kao-Shuo ; Venkatesan, T. ; Loughran, T. C. ; Vispute, R. D. ; Yedave, S. N. / Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector. In: Materials Research Society Symposium - Proceedings. 2003 ; Vol. 785. pp. 495-499.
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abstract = "In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10{\%} and 20{\%} in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.",
author = "Hullavarad, {S. S.} and I. Takeuchi and J. Berger and S. Dhar and Kao-Shuo Chang and T. Venkatesan and Loughran, {T. C.} and Vispute, {R. D.} and Yedave, {S. N.}",
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Hullavarad, SS, Takeuchi, I, Berger, J, Dhar, S, Chang, K-S, Venkatesan, T, Loughran, TC, Vispute, RD & Yedave, SN 2003, 'Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector', Materials Research Society Symposium - Proceedings, vol. 785, pp. 495-499.

Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector. / Hullavarad, S. S.; Takeuchi, I.; Berger, J.; Dhar, S.; Chang, Kao-Shuo; Venkatesan, T.; Loughran, T. C.; Vispute, R. D.; Yedave, S. N.

In: Materials Research Society Symposium - Proceedings, Vol. 785, 01.12.2003, p. 495-499.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Accelerated reliability test inputs in analyzing the device response of MgZnO based UV detector

AU - Hullavarad, S. S.

AU - Takeuchi, I.

AU - Berger, J.

AU - Dhar, S.

AU - Chang, Kao-Shuo

AU - Venkatesan, T.

AU - Loughran, T. C.

AU - Vispute, R. D.

AU - Yedave, S. N.

PY - 2003/12/1

Y1 - 2003/12/1

N2 - In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.

AB - In this paper we present the accelerated reliability testing of MgZnO based UV detectors. The UV detectors are fabricated on glass, quartz and sapphire substrates by Pulsed Laser Deposition (PLD) technique. The films are highly oriented and show sharp transmission at 350nm and 330nm for Mg composition of 10% and 20% in ZnO, respectively. The device response has been studied and life expectancy of the devices has been estimated from the accelerated tests.

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JO - Materials Research Society Symposium - Proceedings

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