Accumulator-based output selection for test response compaction

Wei Cheng Lien, Kuen-Jong Lee, Tong Yu Hsieh, Shih Shiun Chien, Krishnendu Chakrabarty

Research output: Contribution to conferencePaperpeer-review

1 Citation (Scopus)

Abstract

Output selection is a recently proposed test response compaction method, where only a subset of output response bits is selected for observation. It can achieve zero aliasing, full X-tolerance, and high diagnosability. We propose an output selection scheme for multiple scan designs, which employs only accumulators and multiplexers, and thus involves small area overhead and simple test control. An efficient selection procedure is presented to determine a minimal test set and the corresponding output bits to select for complete fault coverage. Experimental results show that when only one accumulator and one multiplexer are employed, 100% single stuck-at fault coverage for ISCAS'89 (ITC'99) circuits can be achieved by observing only 9.84% (8.19%) of the test response bits with only 1.86% (1.18%) area overhead.

Original languageEnglish
Pages2313-2316
Number of pages4
DOIs
Publication statusPublished - 2012 Sep 28
Event2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 - Seoul, Korea, Republic of
Duration: 2012 May 202012 May 23

Other

Other2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012
CountryKorea, Republic of
CitySeoul
Period12-05-2012-05-23

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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